Project information
Výzkum dielektrických vrstev TixSiyOz připravených plazmochemickou metodou (PECVD) pro optické a elektronické aplikace
- Project Identification
- 7AMB15FR036
- Project Period
- 1/2015 - 12/2016
- Investor / Pogramme / Project type
-
Ministry of Education, Youth and Sports of the CR
- Mobility Activity
- MU Faculty or unit
- Central European Institute of Technology
TiO2 thin films exhibit high dielectric constant (between 50 and 100) and optical refractive index (1.8 Total number of publications: 2 Applied Surface Science, year: 2020, volume: 510, edition: April 2020, DOI Physical Review B, year: 2017, volume: 95, edition: 19, DOIPublications
2020
Unravelling local environments in mixed TiO2-SiO2 thin films by XPS and ab initio calculations
2017
Optical properties of TixSi1-xO2 solid solutions