prof. RNDr. Václav Holý, CSc.

1998

• High-resolutin x-ray diffraction and x-ray reflectivity studies of short-period CdTe/MnTe-superlattices

  STANGL J. DARHUBER A.A. HOLÝ Václav DE NAUROIS M. FERREIRA S. FASCHINGER W. BAUER G.

  Article in Periodical

  Journal of crystal growth, year: 1998, volume: 1998, edition: 184/185

• High-resolution x-ray scattering from thin films and multilayers

  HOLÝ Václav PIETSCH U. BAUMBACH T.

  Monograph

  Year: 1998, number of pages: 256 s.

• Characterization of surfaces and interfaces by hard x-ray reflectometry and diffuse scattering at grazing incidence

  JERGEL M. MAJKOVÁ E. LUBY S. SENDERÁK R. HOLÝ Václav

  Article in Periodical

  Acta Physica Slovaca, year: 1998, volume: 1998, edition: 48

• Oblique roughness replication in strained SiGe/Si multilayers

  HOLÝ Václav DARHUBER A.A. STANGL J. BAUER G. NUETZEL J. ABSTREITER G.

  Article in Periodical

  Physical Review B, year: 1998, volume: (57)1998, edition: 19

• Self-organized growth of three-dimensional quantum-dot crystals with fcc-like stacking and a tunable lattice constant

  SPRINGHOLZ G. HOLÝ Václav PINCZOLITS M. BAUER G.

  Article in Periodical

  Physical Review Letters, year: 1998, volume: 282(1998), edition: 23

• Strain relaxation and surface morphology of compositionally graded Si/SiGe buffers

  LI J.H. SPRINGHOLZ G. STANGL G. SEYRINGER H. HOLÝ Václav SCHAFFLER F. BAUER G.

  Article in Periodical

  J. Vac. Sci & Technol., year: 1998, volume: 1998, edition: B16

• Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods

  DARHUBER A.A. HOLÝ Václav SCHITTENHELM P. STANGL J. KEGEL I. KOVATS Z. METZGER T.H. BAUER G. ABSTREITER G. GRUEBEL G.

  Article in Periodical

  Physica E 2, year: 1998, volume: 1998, edition: -

• X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers

  HOLÝ Václav DARHUBER A.A. STANGL J. BAUER G. NUTZEL J. ABSTREITER G.

  Article in Periodical

  Semicond. Sci. Technol., year: 1998, volume: 13(1998), edition: -

• X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics

  JERGEL M. HOLÝ Václav MAJKOVÁ E. LUBY S. SENDERÁK R. STOCK H.J. MENKE D. KLEINEBERG U. HEINZMANN U.

  Article in Periodical

  Physica B condensed matter, year: 1998, volume: 253(1998), edition: -

1997

• Diffuse X-ray reflection from multilayers with stepped interfaces

  HOLÝ Václav

  Article in Periodical

  Physical Review B, year: 1997, volume: (55)1997, edition: 15