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Cited article | All Journals | Biological Journals | Chemical Journals | Physical Journals | Medical Journals | Mathematical Journals | Earth Sciences Journals | Others Journals
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n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit.
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1000—99999 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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500—999 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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200—499 | 2 | 527 | 2 | 527 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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100—199 | 11 | 1411 | 9 | 1152 | 3 | 366 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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50—99 | 31 | 2158 | 14 | 995 | 9 | 624 | 4 | 275 | 5 | 383 | 0 | 0 | 6 | 395 | 0 | 0
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20—49 | 74 | 2271 | 28 | 851 | 27 | 841 | 13 | 391 | 8 | 265 | 8 | 232 | 12 | 379 | 0 | 0
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10—19 | 73 | 1053 | 18 | 274 | 24 | 347 | 15 | 222 | 12 | 165 | 12 | 175 | 5 | 71 | 1 | 19
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5—9 | 37 | 263 | 13 | 91 | 14 | 102 | 8 | 57 | 4 | 32 | 2 | 14 | 6 | 39 | 1 | 5
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2—4 | 31 | 92 | 11 | 27 | 7 | 22 | 6 | 21 | 3 | 10 | 8 | 25 | 2 | 5 | 1 | 3
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1—1 | 12 | 12 | 2 | 2 | 7 | 7 | 2 | 2 | 1 | 1 | 1 | 1 | 0 | 0 | 0 | 0
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0—0 | 5 | 0 | 1 | 0 | 1 | 0 | 1 | 0 | 0 | 0 | 2 | 0 | 0 | 0 | 0 | 0
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Sum | 276 | 7787 | 98 | 3919 | 92 | 2309 | 49 | 968 | 33 | 856 | 33 | 447 | 31 | 889 | 3 | 27 |
Physical Journals
Cited: 5—9
- Cited 9 times
Fewster, PF; Holy, V; Zhi, D. Composition determination in quantum dots with in-plane scattering compared with STEM and EDX analysis. J. Phys. D-Appl. Phys.. 36, A217-A221, 5p, ISSN/eISSN: 0022-3727/1361-6463, (MAY 21 2003) ,WOS:000183446300046 Cited: 9 times
- Cited 9 times
Klapetek, P; Ohlídal, I; Montaigne-Ramil, A; Bonanni, A; Stifter, D; Sitter, H. Atomic force microscopy characterization of ZnTe epitaxial thin films. Jpn. J. Appl. Phys. Part 1 - Regul. Pap. Brief Commun. Rev. Pap.. 42, 4706-4709, 4p, ISSN/eISSN: 0021-4922/, (JUL 2003) DOI: https://doi.org/10.1143/JJAP.42.4706 ,WOS:000184780100024 Cited: 9 times
- Cited 8 times
Ohlídal, M; Ohlídal, I; Klapetek, P; Jákl, M; Cudek, V; Eliás, M. New method for the complete optical analysis of thin films nonuniform in optical parameters. Jpn. J. Appl. Phys. Part 1 - Regul. Pap. Short Notes Rev. Pap.. 42, 4760-4763, 4p, ISSN/eISSN: 0021-4922/, (JUL 2003) ,WOS:000184780100037 Cited: 8 times
- Cited 7 times
Hinterleitner, F; Major, S. Isotropic loop quantum cosmology with matter. II. The Lorentzian constraint. Phys. Rev. D. 68, -, 8p, ISSN/eISSN: 2470-0010/2470-0029, (DEC 15 2003) DOI: https://doi.org/10.1103/PhysRevD.68.124023 ,WOS:000187969200053 Cited: 7 times
- Cited 7 times
Pardy, M. Electron in an ultrashort laser pulse. Int. J. Theor. Phys.. 42, 99-110, 12p, ISSN/eISSN: 0020-7748/1572-9575, (JAN 2003) ,WOS:000182210800010 Cited: 7 times
- Cited 7 times
Janík, J; Harmanec, P; Lehmann, H; Yang, S; Bozic, H; Ak, H; Hadrava, P; Eenens, P; Ruzdjak, D; Sudar, D; Hubeny, I; Linnell, AP. Search for forced oscillations in binaries -: IV.: The eclipsing binary V436 Per revisited. Astron. Astrophys.. 408, 611-619, 9p, ISSN/eISSN: 0004-6361/, (SEP 2003) DOI: https://doi.org/10.1051/0004-6361:20030960 ,WOS:000185006700018 Cited: 7 times
- Cited 5 times
Kadlecíková, M; Breza, J; Vesely, M; Frgala, Z; Kudrle, V; Janca, J; Janík, J; Bursík, J. Raman bands in microwave plasma assisted chemical vapour deposited films. Microelectron. J.. 34, 1075-1077, 3p, ISSN/eISSN: 0026-2692/, (NOV 2003) DOI: https://doi.org/10.1016/j.mejo.2003.09.002 ,WOS:000186534500013 Cited: 5 times
- Cited 5 times
Sopousek, J; Million, B. Carbon profile analysis of Fe-Cr-C/Fe-Cr-Ni-C diffusion joints. Kov. Mater.-Met. Mater.. 41, 118-126, 9p, ISSN/eISSN: 0023-432X/1338-4252, ( 2003) ,WOS:000182522600005 Cited: 5 times
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