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Publication year: 1996

Cited articleAll JournalsBiological JournalsChemical JournalsPhysical JournalsMedical JournalsMathematical JournalsEarth Sciences JournalsOthers Journals
n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.
1000—999990000000000000000
500—9990000000000000000
200—4990000000000000000
100—1990000000000000000
50—99749331823227211100002138174
20—492053751311132237038312026400
10—1927353339141801012911022900227
5—928190857149575019151518
2—4278110321236411134140000
1—114141110104400000011
0—0170301004000100000
Sum1401668334427487034375610596852075110

Physical Journals

Cited: 5—9
  1. Cited 9 times
    Bauer, G; Li, JH; Holy, V. High resolution x-ray reciprocal space mapping. Acta Phys. Pol. A. 89, 115-127, 13p, ISSN/eISSN: 0587-4246/, (FEB 1996) ,WOS:A1996UD40100002 Cited: 9 times
  2. Cited 9 times
    Jergel, M; Bochnicek, Z; Majkova, E; Senderak, R; Luby, S. Thermally activated interface shift in the tungsten/silicon multilayers. Appl. Phys. Lett.. 69, 919-921, 3p, ISSN/eISSN: 0003-6951/, (AUG 12 1996) ,WOS:A1996VB47400018 Cited: 9 times
  3. Cited 8 times
    Litzman, O; Mikulik, P; Dub, P. Multiple diffraction of particles by a system of point scatterers as an exactly soluble problem using the Ewald concept. J. Phys.-Condes. Matter. 8, 4709-4725, 17p, ISSN/eISSN: 0953-8984/1361-648X, (JUN 24 1996) ,WOS:A1996UU80500004 Cited: 8 times
  4. Cited 8 times
    Darhuber, AA; Holy, V; Bauer, G; Wang, PD; Song, YP; Torres, CMS; Holland, MC. Quantitative analysis of elastic strains in GaAs/AlAs quantum dots. Physica B. 227, 11-16, 6p, ISSN/eISSN: 0921-4526/, (SEP 1996) ,WOS:A1996VR71500005 Cited: 8 times
  5. Cited 6 times
    Hora, J; Navratil, K; Humlicek, J; Berkowski, M. Optical anisotropy of SrLaAlO4 and SrLaAl0.75Ga0.25O4 single crystals. Phys. Status Solidi B-Basic Res.. 195, 625-635, 11p, ISSN/eISSN: 0370-1972/, (JUN 1996) ,WOS:A1996UT87500028 Cited: 6 times
  6. Cited 5 times
    Hlavka, J; Svehla, R. Measurement of fast surface photovoltage relaxation. Rev. Sci. Instrum.. 67, 2588-2589, 2p, ISSN/eISSN: 0034-6748/, (JUL 1996) ,WOS:A1996UW83400028 Cited: 5 times
  7. Cited 5 times
    Cermak, J; Stloukal, I; Ruzickova, J. Influence of boron on nickel grain boundary self-diffusion in Ni3Al intermetallic. Phys. Status Solidi A-Appl. Res.. 158, 35-38, 4p, ISSN/eISSN: 0031-8965/, (NOV 1996) ,WOS:A1996VY72800004 Cited: 5 times

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