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Publication year: 1997

Cited articleAll JournalsBiological JournalsChemical JournalsPhysical JournalsMedical JournalsMathematical JournalsEarth Sciences JournalsOthers Journals
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1000—999990000000000000000
500—9990000000000000000
200—4990000000000000000
100—199451911262288000011050000
50—99149334275749621751592108211200
20—49298957213144276185414931095136131
10—1929393562162185812266740000
5—923160127911784272152160018
2—427836191133720146180014
1—1161611993300330011
0—0170101204000200000
Sum1592999377758215493149110253254337248444

Physical Journals

Cited: 20—49
  1. Cited 49 times
    Giester, G; Unfried, P; Zak, Z. Syntheses and crystal structures of some new rare earth basic nitrates .2. [Ln(6)O(OH)(8)(H2O)(12)(NO3)(6)](NO3)(2).xH(2)O, Ln=Sm, Dy, Er; x(Sm)=6, x(Dy)=5, x(Er)=4. J. Alloy. Compd.. 257, 175-181, 7p, ISSN/eISSN: 0925-8388/, (JUL 25 1997) ,WOS:A1997XW88700029 Cited: 49 times
  2. Cited 38 times
    Holy, V; Giannini, C; Tapfer, L; Marschner, T; Stolz, W. Diffuse x-ray reflection from multilayers with stepped interfaces. Phys. Rev. B. 55, 9960-9968, 9p, ISSN/eISSN: 0163-1829/, (APR 15 1997) ,WOS:A1997WV25100123 Cited: 38 times
  3. Cited 30 times
    Kanicky, V; Musil, J; Mermet, JM. Determination of Zr and Ti in 3-mu m-thick ZrTiN ceramic coating using laser ablation inductively coupled plasma atomic emission spectrometry. Appl. Spectrosc.. 51, 1037-1041, 5p, ISSN/eISSN: 0003-7028/, (JUL 1997) ,WOS:A1997XP06800021 Cited: 30 times
  4. Cited 25 times
    Kanicky, V; Novotny, I; Musil, J; Mermet, JM. Depth profiling of thick layers of graded metal zirconia ceramic coatings using laser ablation inductively coupled plasma atomic emission spectrometry. Appl. Spectrosc.. 51, 1042-1046, 5p, ISSN/eISSN: 0003-7028/, (JUL 1997) ,WOS:A1997XP06800022 Cited: 25 times
  5. Cited 22 times
    Kanicky, V; Mermet, JM. Selection of internal standards for the determination of major and minor elements in silicate rocks and limestones by laser ablation inductively coupled plasma atomic emission spectrometry. Appl. Spectrosc.. 51, 332-336, 5p, ISSN/eISSN: 0003-7028/, (MAR 1997) ,WOS:A1997WT58600007 Cited: 22 times
  6. Cited 21 times
    Li, JH; Holy, V; Bauer, F; Schaffler, F. Strain relaxation in high electron mobility Si1-xGex/Si structures. J. Appl. Phys.. 82, 2881-2886, 6p, ISSN/eISSN: 0021-8979/, (SEP 15 1997) ,WOS:A1997XX99600023 Cited: 21 times

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