Přehled publikací

Publication year: 2017

Cited article	All Journals		Multidisciplinary Journals		Biological Journals		Chemical Journals		Physical Journals		Medical Journals		Mathematical Journals		Earth Sciences Journals		Others Journals
Cited article	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.
1000—99999	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0
500—999	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0
200—499	9	2927	0	0	3	878	4	1343	2	629	1	461	0	0	3	865	1	259
100—199	18	2505	0	0	9	1248	2	289	3	398	1	128	0	0	6	831	0	0
50—99	57	3807	2	125	22	1555	11	655	15	945	7	498	0	0	13	892	4	250
20—49	184	5692	14	458	66	1961	34	1017	31	951	30	925	8	214	47	1536	9	292
10—19	219	3062	11	150	81	1160	38	521	45	609	32	464	7	88	53	748	18	246
5—9	152	1061	5	42	52	353	26	185	33	238	27	185	8	56	33	231	7	50
2—4	104	318	1	3	26	80	22	66	20	58	14	46	18	51	20	63	4	13
1—1	29	29	0	0	6	6	6	6	6	6	6	6	6	6	3	3	2	2
0—0	15	0	0	0	6	0	4	0	3	0	0	0	3	0	0	0	0	0
Sum	787	19401	33	778	271	7241	147	4082	158	3834	118	2713	50	415	178	5169	45	1112

Cited: 2—4

Cited 4 times
Maydannik, PS; Natarajan, G; Cameron, DC. Atomic layer deposition of nanocrystallite arrays of copper(I) chloride for optoelectronic structures. J. Mater. Sci.-Mater. Electron.. 28, 11695-11701, 7p, ISSN/eISSN: 0957-4522/1573-482X, (AUG 2017) DOI: https://doi.org/10.1007/s10854-017-6973-8 ,WOS:000406196200018 Cited: 4 times
Cited 3 times
Chylová, M; Marko, M; Dragasek, J; Vircík, M; Rovny, R; Roháriková, V; Murínová, J; Cimrová, B; Katina, S; Riecansky, I. Slovak adaptation of the Schizotypal Personality Questionnaire. Cesk. Psychol.. 61, 267-280, 14p, ISSN/eISSN: 0009-062X/1804-6436, ( 2017) ,WOS:000411863800005 Cited: 3 times
Cited 3 times
Prokes, L; Hegrová, J; Kanicky, V. Analysis of Means (ANOM) as a Tool for Comparison of Sample Treatment Methods: Testing Various Mineralization Procedures for Selenium Determination in Biological Materials. J. AOAC Int.. 100, 236-240, 5p, ISSN/eISSN: 1060-3271/1944-7922, (JAN-FEB 2017) DOI: https://doi.org/10.5740/jaoacint.16-0258 ,WOS:000392041200031 Cited: 3 times
Cited 3 times
Vodák, J; Necas, D; Ohlídal, M; Ohlídal, I. Determination of local thickness values of non-uniform thin films by imaging spectroscopic reflectometer with enhanced spatial resolution. Meas. Sci. Technol.. 28, -, 6p, ISSN/eISSN: 0957-0233/1361-6501, (FEB 2017) DOI: https://doi.org/10.1088/1361-6501/aa5534 ,WOS:000399552200001 Cited: 3 times