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Publication year: 1998

Cited articleAll JournalsMultidisciplinary JournalsBiological JournalsChemical JournalsPhysical JournalsMedical JournalsMathematical JournalsEarth Sciences JournalsOthers Journals
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20—493087500113311649312361002505145126
10—1934469001318415201912322911200227
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Physical Journals

Cited: 2—4
  1. Cited 4 times
    Franta, D; Ohlidal, I. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Opt. Commun.. 147, 349-358, 10p, ISSN/eISSN: 0030-4018/, (FEB 15 1998) ,WOS:000073389100026 Cited: 4 times
  2. Cited 4 times
    Vrestal, J; Theiner, J; Broz, P; Tomiska, J. Mass-spectrometric determination of the thermodynamic mixing behavior of liquid ternary Fe-Ni-Cr alloys. Thermochim. Acta. 319, 193-200, 8p, ISSN/eISSN: 0040-6031/, (OCT 5 1998) ,WOS:000076523600024 Cited: 4 times
  3. Cited 4 times
    Hala, J. Solvent extraction of europium from aqueous-organic solutions by solvating extractants. J. Radioanal. Nucl. Chem.. 230, 135-141, 7p, ISSN/eISSN: 0236-5731/, (APR 1998) ,WOS:000073463900023 Cited: 4 times
  4. Cited 3 times
    Ohlidal, I; Franta, D. Ellipsometry of thin films. Acta Phys. Slovaca. 48, 459-468, 10p, ISSN/eISSN: 0323-0465/, (AUG 1998) ,WOS:000075856700006 Cited: 3 times
  5. Cited 2 times
    Paseka, J. On some duality for orthoposets. Int. J. Theor. Phys.. 37, 155-161, 7p, ISSN/eISSN: 0020-7748/, (JAN 1998) ,WOS:000072737900021 Cited: 2 times
  6. Cited 2 times
    Vávra, I; Bydzovsky, J; Svec, P; Harvanka, M; Dérer, J; Frait, Z; Kambersky, V; Lopusník, R; Visnovsky, S; Kubena, J; Holy, V. Structural, electrical and magnetic properties of Fe/Si and Fe/FeSi multilayers. Acta Phys. Slovaca. 48, 743-746, 4p, ISSN/eISSN: 0323-0465/, (DEC 1998) ,WOS:000077972000036 Cited: 2 times
  7. Cited 2 times
    Jergel, M; Majkova, E; Luby, S; Senderak, R; Holy, V. Characterization of surfaces and interfaces by hard X-ray reflectometry and diffuse scattering at grazing incidence. Acta Phys. Slovaca. 48, 427-440, 14p, ISSN/eISSN: 0323-0465/, (AUG 1998) ,WOS:000075856700003 Cited: 2 times
  8. Cited 2 times
    Kucirkova, A; Navratil, K; Zemek, J. Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films. Thin Solid Films. 323, 53-58, 6p, ISSN/eISSN: 0040-6090/, (JUN 22 1998) ,WOS:000074746000009 Cited: 2 times
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