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Publication year: 2004

Cited articleAll JournalsMultidisciplinary JournalsBiological JournalsChemical JournalsPhysical JournalsMedical JournalsMathematical JournalsEarth Sciences JournalsOthers Journals
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Physical Journals

Cited: 10—19
  1. Cited 18 times
    Klapetek, P; Ohlídal, I; Bílek, J. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. 102, 51-59, 9p, ISSN/eISSN: 0304-3991/1879-2723, (DEC 2004) DOI: https://doi.org/10.1016/j.ultramic.2004.08.005 ,WOS:000225516200007 Cited: 18 times
  2. Cited 18 times
    Chvátalová, K; Houserová, J; Sob, M; Vrest'ál, J. First-principles calculations of energetics of sigma phase formation and thermodynamic modelling in Fe-Ni-Cr system. J. Alloy. Compd.. 378, 71-74, 4p, ISSN/eISSN: 0925-8388/1873-4669, (SEP 22 2004) DOI: https://doi.org/10.1016/j.jallcom.2003.10.071 ,WOS:000223801100011 Cited: 18 times
  3. Cited 17 times
    Sopousek, J; Foret, R; Jan, V. Simulation of dissimilar weld joints of steel P91. Sci. Technol. Weld. Join.. 9, 59-64, 6p, ISSN/eISSN: 1362-1718/1743-2936, (JAN 2004) DOI: https://doi.org/10.1179/136217104225017161 ,WOS:000220786700009 Cited: 17 times
  4. Cited 16 times
    Ohlídal, I; Franta, D; Frumar, M; Jedelesky, J; Omasta, J. Influence of composition, exposure and thermal annealing on optical properties of As-S chalcogenide thin films. J. Optoelectron. Adv. Mater.. 6, 139-148, 10p, ISSN/eISSN: 1454-4164/, (MAR 2004) ,WOS:000220389800017 Cited: 16 times
  5. Cited 15 times
    Mesko, M; Bonaventura, Z; Vasina, P; Tálsky, A; Frgala, Z; Kudrle, V; Janca, J. Electron density measurements in afterglow of high power pulsed microwave discharge. Plasma Sources Sci. Technol.. 13, 562-568, 7p, ISSN/eISSN: 0963-0252/, (NOV 2004) ,WOS:000225421400003 Cited: 15 times
  6. Cited 15 times
    Baufeld, B; Bartsch, M; Broz, P; Schmücker, M. Microstructural changes as postmortem temperature indicator in Ni-Co-Cr-Al-Y oxidation protection coatings. Mater. Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process.. 384, 162-171, 10p, ISSN/eISSN: 0921-5093/, (OCT 25 2004) DOI: https://doi.org/10.1016/j.msea.2004.05.052 ,WOS:000224489300019 Cited: 15 times
  7. Cited 14 times
    Lechner, RT; Schülli, TU; Holy, V; Springholz, G; Stangl, J; Raab, A; Bauer, G; Metzger, TH. Ordering parameters of self-organized three-dimensional quantum-dot lattices determined from anomalous x-ray diffraction. Appl. Phys. Lett.. 84, 885-887, 3p, ISSN/eISSN: 0003-6951/, (FEB 9 2004) DOI: https://doi.org/10.1063/1.1644627 ,WOS:000188763800017 Cited: 14 times
  8. Cited 14 times
    Franta, D; Ohlídal, I; Klapetek, P; Cabarrocas, PRI. Complete characterization of rough polymorphous silicon films by atomic force microscopy and the combined method of spectroscopic ellipsometry and spectroscopic reflectometry. Thin Solid Films. 455, 399-403, 5p, ISSN/eISSN: 0040-6090/, (MAY 1 2004) DOI: https://doi.org/10.1016/j.tsf.2003.11.237 ,WOS:000221690000071 Cited: 14 times
  9. Cited 13 times
    Dubroka, A; Munzar, D. Phonon anomalies in trilayer high-Tc cuprate superconductors. Physica C. 405, 133-147, 15p, ISSN/eISSN: 0921-4534/, (JUN 1 2004) DOI: https://doi.org/10.1016/j.physc.2004.02.001 ,WOS:000221553800006 Cited: 13 times
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