Choice publication year: 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 all

Publication year: 2001

Cited articleAll JournalsMultidisciplinary JournalsBiological JournalsChemical JournalsPhysical JournalsMedical JournalsMathematical JournalsEarth Sciences JournalsOthers Journals
n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.
1000—99999000000000000000000
500—999215361947001589158900000000
200—499276800276813060000000000
100—1995643001135225711071144000000
50—9927175600181158856753443170003170157
20—49722291002373030968154536205102955167125
10—19354950015222812610126575337458111
5—9392900011811310114942144331819
2—431950012113412373107211400
1—111110022331111660000
0—0900000402000300000
Sum233788519477330988129516117512161933392144074102

Physical Journals

Cited: 10—19
  1. Cited 18 times
    Soto-Guerrero, J; Gajdosová, D; Havel, J. Uranium oxide clusters by laser desorption ionization during MALDI-TOF MS analysis of uranium(VI). J. Radioanal. Nucl. Chem.. 249, 139-143, 5p, ISSN/eISSN: 0236-5731/, (JUL 2001) ,WOS:000170616400022 Cited: 18 times
  2. Cited 17 times
    Chmelík, J; Planeta, J; Rehulka, P; Chmelík, J. Determination of molecular mass distribution of silicone oils by supercritical fluid chromatography, matrix-assisted laser desorption ionization time-of-flight mass spectrometry and their off-line combination. J. Mass Spectrom.. 36, 760-770, 11p, ISSN/eISSN: 1076-5174/1096-9888, (JUL 2001) ,WOS:000170299700007 Cited: 17 times
  3. Cited 13 times
    Vrestál, J. Recent progress in modelling of sigma-phase. Arch. Metall.. 46, 239-247, 9p, ISSN/eISSN: 0860-7052/, ( 2001) ,WOS:000172584000002 Cited: 13 times
  4. Cited 13 times
    Adamaszek, K; Bro, P; Kucera, J; Limoge, Y; Bocquet, JL. Decarburization and hardness changes in carbon steels caused by high-temperature surface oxidation in ambient air. DEFECT DIFFUS FORUM. 194-1, 1701-1706, 6p, ISSN/eISSN: /, ( 2001) ,WOS:000171690100234 Cited: 13 times
  5. Cited 11 times
    Schubert, M; Kasic, A; Sik, J; Einfeldt, S; Hommel, D; Härle, V; Off, J; Scholz, F. Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by infrared ellipsometry and Raman spectroscopy. Mater. Sci. Eng. B-Solid State Mater. Adv. Technol.. 82, 178-181, 4p, ISSN/eISSN: 0921-5107/, (MAY 22 2001) ,WOS:000168618700052 Cited: 11 times
  6. Cited 11 times
    Roch, T; Holy, V; Daniel, A; Höfflinger, E; Meduna, M; Metzger, TH; Bauer, G; Zhu, J; Brunner, K; Abstreiter, G. X-ray studies on self-organized wires in SiGe/Si multilayers. J. Phys. D-Appl. Phys.. 34, A6-A10, 5p, ISSN/eISSN: 0022-3727/, (MAY 21 2001) ,WOS:000169093700003 Cited: 11 times
  7. Cited 11 times
    Fewster, PF; Holy, V; Andrew, NL. Detailed structural analysis of semiconductors with X-ray scattering. Mater. Sci. Semicond. Process. 4, 475-481, 7p, ISSN/eISSN: 1369-8001/, (DEC 2001) ,WOS:000175066200005 Cited: 11 times
  8. Cited 11 times
    Navrátilová, H. Enantiomeric analysis of (3S,4R)-4-(4-fluorophenyl)-3-hydroxymethyl-1-methylpiperidine by 19F NMR spectroscopy. Magn. Reson. Chem.. 39, 727-730, 4p, ISSN/eISSN: 0749-1581/, (NOV 2001) ,WOS:000171940300012 Cited: 11 times
  9. Cited 11 times
    Anopchenko, A; Jergel, M; Majková, E; Luby, S; Holy, V; Aschentrup, A; Kolina, I; Lim, YC; Haindl, G; Kleineberg, U; Heinzmann, U. Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers -: X-ray comparative study. Physica B. 305, 14-20, 7p, ISSN/eISSN: 0921-4526/1873-2135, (OCT 2001) ,WOS:000171072500003 Cited: 11 times
  10. Cited 10 times
    Li, JH; Holy, V; Zhong, Z; Kulik, J; Moss, SC; Norman, AG; Mascarenhas, A; Reno, JL; Follstaedt, DM. X-ray analysis of spontaneous lateral modulation in (InAs)n/(AlAs)m short-period superlattices. Appl. Phys. Lett.. 78, 219-221, 3p, ISSN/eISSN: 0003-6951/, (JAN 8 2001) ,WOS:000166212700028 Cited: 10 times
downoaded from wos: 2024-05-31 23:46:50