Přehled publikací

Choice publication year: 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 all

Publication year: 1998

Cited article	All Journals		Multidisciplinary Journals		Biological Journals		Chemical Journals		Physical Journals		Medical Journals		Mathematical Journals		Earth Sciences Journals		Others Journals
Cited article	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.	n. art.	n. cit.
1000—99999	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0
500—999	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0	0
200—499	3	920	1	447	1	268	1	268	1	268	1	205	0	0	1	205	0	0
100—199	3	333	0	0	2	218	1	115	0	0	0	0	0	0	0	0	0	0
50—99	13	846	0	0	3	228	4	269	3	200	3	173	0	0	2	109	0	0
20—49	30	875	0	0	11	331	16	493	12	361	0	0	2	50	5	145	1	26
10—19	34	469	0	0	13	184	15	201	9	123	2	29	1	12	0	0	2	27
5—9	30	210	0	0	8	49	17	117	8	57	2	16	3	23	1	6	0	0
2—4	30	78	0	0	5	14	15	39	8	23	1	4	6	15	1	2	1	2
1—1	9	9	0	0	1	1	3	3	2	2	0	0	4	4	0	0	1	1
0—0	18	0	0	0	2	0	10	0	5	0	0	0	1	0	1	0	0	0
Sum	170	3740	1	447	46	1293	82	1505	48	1034	9	427	17	104	11	467	5	56

Physical Journals

Cited: 10—19

Cited 18 times
Jergel, M; Holy, V; Majkova, E; Luby, S; Senderak, R; Stock, HJ; Menke, D; Kleineberg, U; Heinzmann, U. X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. Physica B. 253, 28-39, 12p, ISSN/eISSN: 0921-4526/1873-2135, (OCT 1998) ,WOS:000075457900003 Cited: 18 times
Cited 17 times
Zák, Z; Perutka, J; Havel, J; Císarová, I; Giester, G. Synthesis and crystal structures of two new cobalt 42-oxododecatungstates, [Co₄Na(H₂O)₂₁][H(H₂W₁₂O₄₂)].18H₂O and [Co₅(H₂O)₂₂][H₂W₁₂O₄₂].12H₂O. J. Alloy. Compd.. 281, 169-174, 6p, ISSN/eISSN: 0925-8388/, (DEC 18 1998) ,WOS:000077837900017 Cited: 17 times
Cited 15 times
Munzar, D; Dobrocka, E; Vavra, I; Kudela, R; Harvanka, M; Christensen, NE. Antiphasing mechanism of ordered Ga_0.5In_0.5P layers grown on GaAs (001). Phys. Rev. B. 57, 4642-4648, 7p, ISSN/eISSN: 1098-0121/1550-235X, (FEB 15 1998) ,WOS:000072228000066 Cited: 15 times
Cited 15 times
Holy, V; Darhuber, AA; Stangl, J; Bauer, G; Nutzel, J; Abstreiter, G. X-ray reflectivity investigations of the interface morphology in strained SiGe/Si multilayers. Semicond. Sci. Technol.. 13, 590-598, 9p, ISSN/eISSN: 0268-1242/, (JUN 1998) ,WOS:000074143200008 Cited: 15 times
Cited 13 times
Kapicka, V; Klima, M; Vaculik, R; Brablec, A; Slavicek, P; Strecha, M; Sicha, M. The high pressure plasma source for the surface treatment technology based on the torch discharge stabilized by working gas flow. Czech. J. Phys.. 48, 1161-1166, 6p, ISSN/eISSN: 0011-4626/, (OCT 1998) ,WOS:000076739500006 Cited: 13 times
Cited 12 times
Cermak, J; Stloukal, I; Ruzickova, J; Pokorna, A. Short-circuit diffusion in Ni-Al alloys. Intermetallics. 6, 21-28, 8p, ISSN/eISSN: 0966-9795/, ( 1998) ,WOS:000071523600004 Cited: 12 times
Cited 12 times
Mikulik, P; Baumbach, T. X-ray reflection by multilayer surface gratings. Physica B. 248, 381-386, 6p, ISSN/eISSN: 0921-4526/, (JUN 1 1998) ,WOS:000074740900067 Cited: 12 times
Cited 11 times
Humlicek, J. Infrared ellipsometry of LiF. Thin Solid Films. 313, 687-691, 5p, ISSN/eISSN: 0040-6090/, (FEB 1998) ,WOS:000073761700125 Cited: 11 times
Cited 10 times
Franta, D; Ohlidal, I; Munzar, D. Parameterisation of the model of dispersion dependences of solid state optical constants. Acta Phys. Slovaca. 48, 451-458, 8p, ISSN/eISSN: 0323-0465/, (AUG 1998) ,WOS:000075856700005 Cited: 10 times