Choice publication year:
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Cited article | All Journals | Biological Journals | Chemical Journals | Physical Journals | Medical Journals | Mathematical Journals | Earth Sciences Journals | Others Journals
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n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit.
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1000—99999 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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500—999 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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200—499 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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100—199 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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50—99 | 7 | 493 | 3 | 182 | 3 | 227 | 2 | 111 | 0 | 0 | 0 | 0 | 2 | 138 | 1 | 74
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20—49 | 20 | 537 | 5 | 131 | 11 | 322 | 3 | 70 | 3 | 83 | 1 | 20 | 2 | 64 | 0 | 0
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10—19 | 27 | 353 | 3 | 39 | 14 | 180 | 10 | 129 | 1 | 10 | 2 | 29 | 0 | 0 | 2 | 27
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5—9 | 28 | 190 | 8 | 57 | 14 | 95 | 7 | 50 | 1 | 9 | 1 | 5 | 1 | 5 | 1 | 8
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2—4 | 27 | 81 | 10 | 32 | 12 | 36 | 4 | 11 | 1 | 3 | 4 | 14 | 0 | 0 | 0 | 0
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1—1 | 14 | 14 | 1 | 1 | 10 | 10 | 4 | 4 | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 1
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0—0 | 17 | 0 | 3 | 0 | 10 | 0 | 4 | 0 | 0 | 0 | 1 | 0 | 0 | 0 | 0 | 0
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Sum | 140 | 1668 | 33 | 442 | 74 | 870 | 34 | 375 | 6 | 105 | 9 | 68 | 5 | 207 | 5 | 110 |
Physical Journals
Cited: 10—19
- Cited 18 times
Chladek, M; Valvoda, V; Dorner, C; Holy, C; Grim, J. Quantitative study of interface roughness replication in multilayers using X-ray reflectivity and transmission electron microscopy. Appl. Phys. Lett.. 69, 1318-1320, 3p, ISSN/eISSN: 0003-6951/, (AUG 26 1996) ,WOS:A1996VD63200048 Cited: 18 times
- Cited 17 times
Vrestal, J; Stepankova, J; Broz, P. Thermodynamics of the copper-manganese system - Knudsen-cell mass spectrometric study of the liquid Cu-Mn system and calculation of the phase diagram. Scand. J. Metall.. 25, 224-231, 8p, ISSN/eISSN: 0371-0459/, (OCT 1996) ,WOS:A1996WV99800006 Cited: 17 times
- Cited 17 times
Springholz, G; Bauer, G; Holy, V. Scanning-tunneling-microscopy observation of stress-driven surface diffusion due to localized strain fields of misfit dislocations in heteroepitaxy. Phys. Rev. B. 54, 4500-4503, 4p, ISSN/eISSN: 0163-1829/, (AUG 15 1996) ,WOS:A1996VE48800033 Cited: 17 times
- Cited 13 times
Zajickova, L; Ohlidal, I; Janca, J. Plasma-enhanced chemical vapour deposition of thin films from tetraethoxysilane and methanol: Optical properties and XPS analyses. Thin Solid Films. 280, 26-36, 11p, ISSN/eISSN: 0040-6090/, (JUL 1996) ,WOS:A1996VD94000005 Cited: 13 times
- Cited 12 times
Kucirkova, A; Navratil, K; Pajasova, L; Vorlicek, V. Influence of oxygen concentration on optical properties of semi-insulating polycrystalline silicon films. Appl. Phys. A-Mater. Sci. Process.. 63, 495-503, 9p, ISSN/eISSN: 0947-8396/, (NOV 1996) ,WOS:A1996VR93600015 Cited: 12 times
- Cited 11 times
Sicha, M; Hubicka, Z; Tichy, M; Novak, M; Soukup, L; Jastrabik, L; Behnke, JF; Kapicka, V; Kapoun, K; Sery, M. The interaction of the supersonic plasma-jet with the substrate in the RF plasma-chemical reactor. Contrib. Plasma Phys.. 36, 605-611, 7p, ISSN/eISSN: 0863-1042/, ( 1996) ,WOS:A1996VH94100005 Cited: 11 times
- Cited 11 times
Springholz, G; Bauer, G; Holy, V. Local surface deformations induced by interfacial misfit dislocations in lattice-mismatched heteroepitaxy of EuTe on PbTe(111). Surf. Sci.. 365, 453-460, 8p, ISSN/eISSN: 0039-6028/1879-2758, (SEP 20 1996) ,WOS:A1996VH64500027 Cited: 11 times
- Cited 10 times
Janca, J; Talsky, A; Zvonicek, V. Kinetics of O-2+TEOS gas-phase chemical reactions in a remote RF plasma reactor with electron spin resonance. Plasma Chem. Plasma Process.. 16, 187-194, 8p, ISSN/eISSN: 0272-4324/, (JUN 1996) ,WOS:A1996UM01300003 Cited: 10 times
- Cited 10 times
Kunze, J; Broz, P; Sopousek, J; Gruner, W. Thermodynamic investigation of the austenite and the delta ferrite in the system Fe-Cr-Mn-N. Steel Res.. 67, 26-33, 8p, ISSN/eISSN: 0177-4832/, (JAN 1996) ,WOS:A1996TT28700006 Cited: 10 times
- Cited 10 times
Navratil, V; Stejskalova, V. Microhardness of thin solid films. Phys. Status Solidi A-Appl. Res.. 157, 339-344, 6p, ISSN/eISSN: 0031-8965/, (OCT 16 1996) ,WOS:A1996VT88600015 Cited: 10 times
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