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Cited article | All Journals | Biological Journals | Chemical Journals | Physical Journals | Medical Journals | Mathematical Journals | Earth Sciences Journals | Others Journals
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n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit.
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1000—99999 | 1 | 1103 | 1 | 1103 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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500—999 | 2 | 1288 | 2 | 1288 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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200—499 | 1 | 246 | 1 | 246 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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100—199 | 5 | 719 | 3 | 355 | 2 | 289 | 1 | 197 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
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50—99 | 13 | 830 | 4 | 260 | 4 | 233 | 6 | 361 | 3 | 187 | 0 | 0 | 3 | 200 | 1 | 66
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20—49 | 81 | 2600 | 36 | 1207 | 39 | 1213 | 19 | 586 | 8 | 225 | 5 | 140 | 7 | 237 | 4 | 138
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10—19 | 60 | 888 | 18 | 273 | 31 | 466 | 12 | 174 | 4 | 67 | 6 | 86 | 2 | 32 | 4 | 54
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5—9 | 36 | 235 | 11 | 74 | 15 | 96 | 8 | 52 | 2 | 15 | 2 | 13 | 0 | 0 | 1 | 8
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2—4 | 19 | 52 | 5 | 12 | 5 | 13 | 2 | 7 | 2 | 5 | 4 | 13 | 1 | 2 | 1 | 3
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1—1 | 7 | 7 | 1 | 1 | 3 | 3 | 3 | 3 | 0 | 0 | 1 | 1 | 0 | 0 | 1 | 1
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0—0 | 14 | 0 | 0 | 0 | 5 | 0 | 7 | 0 | 1 | 0 | 3 | 0 | 0 | 0 | 0 | 0
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Sum | 239 | 7968 | 82 | 4819 | 104 | 2313 | 58 | 1380 | 20 | 499 | 21 | 253 | 13 | 471 | 12 | 270 |
Physical Journals
Cited: 1—1
- Cited 1 times
Meduna, M; Holy, V; Roch, T; Bauer, G; Schmidt, OG; Eberl, K. Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices. Semicond. Sci. Technol.. 17, 480-486, 7p, ISSN/eISSN: 0268-1242/, (MAY 2002) ,WOS:000175969200016 Cited: 1 times
- Cited 1 times
Sládek, P; St'ahel, P; St'astny, J. Modifications of the optical parameters of silicon thin films due to light scattering. J. Non-Cryst. Solids. 299, 295-299, 5p, ISSN/eISSN: 0022-3093/, (APR 1 2002) ,WOS:000175757400059 Cited: 1 times
- Cited 1 times
Meduna, M; Holy, V; Stangl, J; Hesse, A; Roch, T; Bauer, G; Schmidt, OG; Eberl, K. Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers. Physica E. 13, 1003-1007, 5p, ISSN/eISSN: 1386-9477/, (MAR 2002) ,WOS:000176869100212 Cited: 1 times
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