Choice publication year: 1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 all

Publication year: 2002

Cited articleAll JournalsBiological JournalsChemical JournalsPhysical JournalsMedical JournalsMathematical JournalsEarth Sciences JournalsOthers Journals
n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.n. art.n. cit.
1000—999991110311103000000000000
500—9992128821288000000000000
200—49912461246000000000000
100—199571933552289119700000000
50—99138304260423363613187003200166
20—49812600361207391213195868225514072374138
10—1960888182733146612174467686232454
5—936235117415968522152130018
2—4195251251327254131213
1—17711333300110011
0—014000507010300000
Sum2397968824819104231358138020499212531347112270

All Journals

Cited: 1—1
  1. Cited 1 times
    Marsálek, P; Farková, M; Havel, J. Quantitative MALDI-TOFMS analysis of amino acids applying soft modeling methods. Chem. Pap.-Chem. Zvesti. 56, 188-193, 6p, ISSN/eISSN: 0366-6352/, ( 2002) ,WOS:000177049900009 Cited: 1 times
  2. Cited 1 times
    Meduna, M; Holy, V; Roch, T; Bauer, G; Schmidt, OG; Eberl, K. Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices. Semicond. Sci. Technol.. 17, 480-486, 7p, ISSN/eISSN: 0268-1242/, (MAY 2002) ,WOS:000175969200016 Cited: 1 times
  3. Cited 1 times
    Sládek, P; St'ahel, P; St'astny, J. Modifications of the optical parameters of silicon thin films due to light scattering. J. Non-Cryst. Solids. 299, 295-299, 5p, ISSN/eISSN: 0022-3093/, (APR 1 2002) ,WOS:000175757400059 Cited: 1 times
  4. Cited 1 times
    Kamenicek, J; Valach, F; Kratochvíl, B; Zák, Z. Syntheses and structure of Ni(III) complexes with 1-toluene-3,4-dithiole.: Bond-valence approach to the oxidation state of the central atom. Pol. J. Chem.. 76, 483-490, 8p, ISSN/eISSN: 0137-5083/, (APR 2002) ,WOS:000174629100001 Cited: 1 times
  5. Cited 1 times
    Meduna, M; Holy, V; Stangl, J; Hesse, A; Roch, T; Bauer, G; Schmidt, OG; Eberl, K. Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers. Physica E. 13, 1003-1007, 5p, ISSN/eISSN: 1386-9477/, (MAR 2002) ,WOS:000176869100212 Cited: 1 times
  6. Cited 1 times
    Dadák, V; Janiczek, O; Vrána, O. Cytochrome c forms complexes and is partly reduced at interaction with GPI-anchored alkaline phosphatase. Biochim. Biophys. Acta-Gen. Subj.. 1570, 9-18, 10p, ISSN/eISSN: 0304-4165/1872-8006, (FEB 15 2002) ,WOS:000175219800002 Cited: 1 times
  7. Cited 1 times
    Dosly, O. CONSTANTS IN THE OSCILLATION THEORY OF HIGHER ORDER STURM-LIOUVILLE DIFFERENTIAL EQUATIONS. Electron. J. Differ. Equ.. , -, 12p, ISSN/eISSN: 1072-6691/, ( 2002) ,WOS:000208968900034 Cited: 1 times

Biological Journals

Cited: 1—1
  1. Cited 1 times
    Dadák, V; Janiczek, O; Vrána, O. Cytochrome c forms complexes and is partly reduced at interaction with GPI-anchored alkaline phosphatase. Biochim. Biophys. Acta-Gen. Subj.. 1570, 9-18, 10p, ISSN/eISSN: 0304-4165/1872-8006, (FEB 15 2002) ,WOS:000175219800002 Cited: 1 times

Chemical Journals

Cited: 1—1
  1. Cited 1 times
    Marsálek, P; Farková, M; Havel, J. Quantitative MALDI-TOFMS analysis of amino acids applying soft modeling methods. Chem. Pap.-Chem. Zvesti. 56, 188-193, 6p, ISSN/eISSN: 0366-6352/, ( 2002) ,WOS:000177049900009 Cited: 1 times
  2. Cited 1 times
    Sládek, P; St'ahel, P; St'astny, J. Modifications of the optical parameters of silicon thin films due to light scattering. J. Non-Cryst. Solids. 299, 295-299, 5p, ISSN/eISSN: 0022-3093/, (APR 1 2002) ,WOS:000175757400059 Cited: 1 times
  3. Cited 1 times
    Kamenicek, J; Valach, F; Kratochvíl, B; Zák, Z. Syntheses and structure of Ni(III) complexes with 1-toluene-3,4-dithiole.: Bond-valence approach to the oxidation state of the central atom. Pol. J. Chem.. 76, 483-490, 8p, ISSN/eISSN: 0137-5083/, (APR 2002) ,WOS:000174629100001 Cited: 1 times

Physical Journals

Cited: 1—1
  1. Cited 1 times
    Meduna, M; Holy, V; Roch, T; Bauer, G; Schmidt, OG; Eberl, K. Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices. Semicond. Sci. Technol.. 17, 480-486, 7p, ISSN/eISSN: 0268-1242/, (MAY 2002) ,WOS:000175969200016 Cited: 1 times
  2. Cited 1 times
    Sládek, P; St'ahel, P; St'astny, J. Modifications of the optical parameters of silicon thin films due to light scattering. J. Non-Cryst. Solids. 299, 295-299, 5p, ISSN/eISSN: 0022-3093/, (APR 1 2002) ,WOS:000175757400059 Cited: 1 times
  3. Cited 1 times
    Meduna, M; Holy, V; Stangl, J; Hesse, A; Roch, T; Bauer, G; Schmidt, OG; Eberl, K. Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers. Physica E. 13, 1003-1007, 5p, ISSN/eISSN: 1386-9477/, (MAR 2002) ,WOS:000176869100212 Cited: 1 times

Medical Journals

Cited: 1—1

    Mathematical Journals

    Cited: 1—1
    1. Cited 1 times
      Dosly, O. CONSTANTS IN THE OSCILLATION THEORY OF HIGHER ORDER STURM-LIOUVILLE DIFFERENTIAL EQUATIONS. Electron. J. Differ. Equ.. , -, 12p, ISSN/eISSN: 1072-6691/, ( 2002) ,WOS:000208968900034 Cited: 1 times

    Earth Sciences Journals

    Cited: 1—1

      Others Journals

      Cited: 1—1
      1. Cited 1 times
        Meduna, M; Holy, V; Roch, T; Bauer, G; Schmidt, OG; Eberl, K. Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices. Semicond. Sci. Technol.. 17, 480-486, 7p, ISSN/eISSN: 0268-1242/, (MAY 2002) ,WOS:000175969200016 Cited: 1 times
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