Choice publication year:
1990 1991 1992 1993 1994 1995 1996 1997 1998 1999 2000 2001 2002 2003 2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 2021 2022 2023 2024 allPublication year: 1999
| Cited article | All Journals | Biological Journals | Chemical Journals | Physical Journals | Medical Journals | Mathematical Journals | Earth Sciences Journals | Others Journals
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| n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit. | n. art. | n. cit.
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| 1000—99999 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
|
| 500—999 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
|
| 200—499 | 3 | 727 | 2 | 482 | 0 | 0 | 1 | 245 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
|
| 100—199 | 5 | 741 | 2 | 309 | 2 | 291 | 2 | 273 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0
|
| 50—99 | 13 | 911 | 4 | 266 | 5 | 362 | 2 | 133 | 0 | 0 | 0 | 0 | 4 | 277 | 0 | 0
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| 20—49 | 56 | 1751 | 16 | 533 | 31 | 1001 | 17 | 537 | 4 | 123 | 4 | 112 | 7 | 248 | 1 | 23
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| 10—19 | 38 | 531 | 11 | 166 | 15 | 204 | 9 | 116 | 3 | 36 | 4 | 60 | 2 | 29 | 0 | 0
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| 5—9 | 31 | 216 | 9 | 59 | 12 | 83 | 11 | 79 | 1 | 5 | 3 | 19 | 2 | 14 | 0 | 0
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| 2—4 | 26 | 82 | 6 | 19 | 10 | 33 | 7 | 24 | 2 | 7 | 2 | 4 | 1 | 2 | 3 | 9
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| 1—1 | 10 | 10 | 1 | 1 | 4 | 4 | 4 | 4 | 1 | 1 | 0 | 0 | 0 | 0 | 2 | 2
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| 0—0 | 5 | 0 | 0 | 0 | 1 | 0 | 3 | 0 | 0 | 0 | 1 | 0 | 0 | 0 | 0 | 0
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| Sum | 187 | 4969 | 51 | 1835 | 80 | 1978 | 56 | 1411 | 11 | 172 | 14 | 195 | 16 | 570 | 6 | 34 |
Physical Journals
Cited: 1—1
- Cited 1 times
Fikar, J; Horsky, J. Generating conjecture and Einstein-Maxwell field of plane symmetry. Czech. J. Phys.. 49, 1423-1432, 10p, ISSN/eISSN: 0011-4626/, (OCT 1999) ,WOS:000083393900002 Cited: 1 times
- Cited 1 times
Stangl, J; Holy, V; Darhuber, AA; Mikulík, P; Bauer, G; Zhu, J; Brunner, K; Abstreiter, G. High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si. J. Phys. D-Appl. Phys.. 32, A71-A74, 4p, ISSN/eISSN: 0022-3727/, (MAY 21 1999) ,WOS:000080730000016 Cited: 1 times
- Cited 1 times
Grim, J; Holy, V; Kubena, J; Stangl, J; Darhuber, AA; Zerlauth, S; Schäffler, F; Bauer, G. Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. J. Phys. D-Appl. Phys.. 32, A216-A219, 4p, ISSN/eISSN: 0022-3727/, (MAY 21 1999) ,WOS:000080730000043 Cited: 1 times
- Cited 1 times
Holy, V. Diffuse x-ray reflection from multilayers with rough interfaces. J. Mater. Sci.-Mater. Electron.. 10, 223-226, 4p, ISSN/eISSN: 0957-4522/, (MAY 1999) ,WOS:000080751500009 Cited: 1 times
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