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Rok publikace: 1998

Fyzikální časopisy

Citace: 20x—49x

1. Citováno 44x
   Holy, V; Darhuber, AA; Stangl, J; Zerlauth, S; Schaffler, F; Bauer, G; Darowski, N; Lubbert, D; Pietsch, U; Vavra, I. Coplanar and grazing incidence x-ray-diffraction investigation of self-organized SiGe quantum dot multilayers. Phys. Rev. B. 58, 7934-7943, 10p, ISSN/eISSN: 1098-0121/1550-235X, (SEP 15 1998) ,WOS:000076130500069 Citováno: 44x
2. Citováno 39x
   Janca, J; Czernichowski, A. Wool treatment in the gas flow from gliding discharge plasma at atmospheric pressure. Surf. Coat. Technol.. 98, 1112-1115, 4p, ISSN/eISSN: 0257-8972/, (JAN 1998) ,WOS:000072647200052 Citováno: 39x
3. Citováno 39x
   Sklenár, V; Dieckmann, T; Butcher, SE; Feigon, J. Optimization of triple-resonance HCN experiments for application to larger RNA oligonucleotides. J. Magn. Reson.. 130, 119-124, 6p, ISSN/eISSN: 1090-7807/, (JAN 1998) ,WOS:000072622700017 Citováno: 39x
4. Citováno 36x
   Holy, V; Darhuber, AA; Stangl, J; Bauer, G; Nutzel, J; Abstreiter, G. Oblique roughness replication in strained SiGe/Si multilayers. Phys. Rev. B. 57, 12435-12442, 8p, ISSN/eISSN: 1098-0121/1550-235X, (MAY 15 1998) ,WOS:000073761500094 Citováno: 36x
5. Citováno 33x
   Fiala, R; Jiang, F; Sklenái, V. Sensitivity optimized HCN and HCNCH experiments for ¹³C/¹⁵N labeled oligonucleotides. J. Biomol. NMR. 12, 373-383, 11p, ISSN/eISSN: 0925-2738/, (OCT 1998) ,WOS:000076954300002 Citováno: 33x
6. Citováno 27x
   Zajickova, L; Bursikova, V; Janca, J. Protection coatings for polycarbonates based on PECVD from organosilicon feeds. Vacuum. 50, 19-21, 3p, ISSN/eISSN: 0042-207X/, (MAY-JUN 1998) ,WOS:000074935100006 Citováno: 27x
7. Citováno 26x
   Li, JH; Springholz, G; Stangl, J; Seyringer, H; Holy, V; Schaffler, F; Bauer, G. Strain relaxation and surface morphology of compositionally graded Si/Si_1-xGe_x buffers. J. Vac. Sci. Technol. B. 16, 1610-1615, 6p, ISSN/eISSN: 1071-1023/, (MAY-JUN 1998) ,WOS:000074298300137 Citováno: 26x
8. Citováno 25x
   Kanicky, V; Otruba, V; Mermet, JM. Use of internal standardization to compensate for a wide range of absorbance in the analysis of glasses by UV laser ablation inductively coupled plasma atomic emission spectrometry. Appl. Spectrosc.. 52, 638-642, 5p, ISSN/eISSN: 0003-7028/, (MAY 1998) ,WOS:000074040400004 Citováno: 25x
9. Citováno 24x
   Humlicek, J; Nebojsa, A; Hora, J; Strasky, M; Spousta, J; Sikola, T. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films. 332, 25-29, 5p, ISSN/eISSN: 0040-6090/, (NOV 2 1998) ,WOS:000077202500006 Citováno: 24x
10. Citováno 24x
    Dostál, J; Marek, R; Slavík, J; Táborská, E; Potácek, M; Sklenár, V. Sanguinarine pseudobase:: re-examination of NMR assignments using gradient-enhanced spectroscopy. Magn. Reson. Chem.. 36, 869-872, 4p, ISSN/eISSN: 0749-1581/, (NOV 1998) ,WOS:000076921900011 Citováno: 24x
11. Citováno 23x
    Lowe, DA; von Unge, R. Constraints on higher derivative operators in maximally supersymmetric gauge theory. J. High Energy Phys.. , -, 6p, ISSN/eISSN: 1029-8479/, (FEB 12 1998) ,WOS:000080522600014 Citováno: 23x
12. Citováno 21x
    Janca, J; Sodomka, L. Plasma-polymerised organosiloxane thin films as selective gas sensors. Surf. Coat. Technol.. 98, 851-854, 4p, ISSN/eISSN: 0257-8972/, (JAN 1998) ,WOS:000072647200010 Citováno: 21x

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